WaveMaster® Compact 2 Reflex - Surface Topography Measurements of Single Lenses with Shack-Hartmann Sensors
Optimized for ease-of-use and flexibility, the WaveMaster® Compact 2 Reflex measures surface profiles using a Shack-Hartmann sensor in reflection.
WaveMaster® Compact 2 Reflex
Key Features:
- Fast measurement of surface profiles with Shack-Hartmann sensors
- Fast and easy adaptable to different sample types
- High measurement speed enables high sample throughput
- High precision four axes alignment sample holder for submicron position adjustment.
- Alignment compensation: Only minimum amount of sample alignment necessary when measuring series of samples
- Automatic focusing
- The automatic positioning of the wavefront sensor and the telescope in the exit pupil
- Real time comparison with wavefront data from master lenses or design files
- Point light source with different numerical apertures available (up to 0.95)
- Vibration insensitive
- Comprehensive software for the measurement and analysis of surfaces with Shack-Hartmann sensors
Applications
The WaveMaster® Compact Reflex can be used for the following applications:
- Measuring the surface topography of aspherical lenses, spheres and plane surfaces
- Radius measurement
Surface measurement in reflection with a Shack-Hartmann sensor
Wavefront Measurement with Shack-Hartman Sensors
The WaveSensor® software is clearly structured, easy to use and contains all functions to measure and analyze plano, spherical and aspherical samples with the WaveSensor®.
The software communicates with the Shack-Hartmann sensor and analyzes the measured wavefront in real time.
Advantages:
- Menu-driven operator guidance
- Simple and intuitive measurement and analysis of wavefronts and surfaces
- One software package for everything: Data collection, data calculation, calibration, display of data, real-time analysis
- Representation of the surface topography through multiple parameterizations:
- Asphere equation
- Zernike polynomials
- Conical equation
- Spherical equation
- Free-form surface
- Load theoretical data from ZEMAX and Code V and compare in real time during measurements
Details on Software:
Basic Functions:
- Real-time measurement and analysis of wavefront
- Display of
- 2D- of 3D-wavefront, -fringes and –phase
- PV and RMS
- Intensity
- Local slopes
- Camera image
- Absolute and relative measurement mode
- Real-time comparison with master lens or design data
- Wavefront and camera image averaging
- Adjustable masking of measurement and analysis area
- Storable configuration files
- Certificates
- Multiple analysis modules available
INSTRUMENT control
- Autofocus function
- Automatic finding of exit pupil plane
- Automatic sample positioning (option)
- Usage of pre-set configurations files
REFLEX module
- Real time surface topography analysis
- Real time surface fit
- Comparison with reference data
- Input of reference data as coefficients or data point cloud
- Pass/Fail classification
- Graphical and numerical display of surface, fit results and comparison with design data
Technical Data of WaveMaster® Compact 2 Reflex
| Measurement configuration: | - Surface topography measurement of lens, - Measurement of lens mold and stamp surfaces - Radius of curvature of best fit sphere - Reflection set up |
|---|---|
| Wavelength: | 365 nm, 635 nm, others on request |
| Sample holder: | - Single seat - Manual positioning |
| Accuracy | < 0.050 µm (RMS) |
| Repeatability | > 0.005 µm (RMS) |
| Dynamic range | > 200 µm |
| Maximum asphericity* | ≤ 7° |
| Measurement frequency | up to 12 Hz |
| Lateral resolution | 138 x 138 |
| Sample diameter | from 0.5 mm up to 17 mm** |
| Sample radius of curvature | from -20 mm up to 30 mm (-50 to +30 on request)*** |
* Local deviation from the best fit sphere
** Depending on radius of curvature and illumination lens
*** Depending on illumination lens and sample diameter
Upgrades & Accessories
The wavefront instruments are characterized by a flexible design which allows for the adaption of the instruments to specific demands of an application. With the help of the following accessories and upgrades the function of the WaveMaster® systems are extended.
Illumination
Light sources with different wavelengths as well as numerical apertures are available. Switching between numerical apertures is simplified due to kinematic mounts.
Reflex modules
TRIOPTICS offers various reflex modules for optimum adaptation to different sample diameters and radii.
WaveMaster® Compact 2 sample holder
