WaveMaster® Compact 2 Universal - Wavefront and Surface Measurements with Shack-Hartmann Sensors
The WaveMaster® Compact 2 Universal measures lenses in both transmission and reflection with TRIOPTICS’ Shack-Hartmann sensor. It is possible to measure the wavefront and surface topography of plano, spherical and aspherical optics with one measurement system by making simple adjustments.
Wavefront and surface measurement with WaveMaster® Compact 2 Universal
Key Features:
- One measurement instrument for the measurement of the wavefront and surface topography
- High measurement speed enables high sample throughput
- Fast and easy adaptable to different sample types
- High precision four axes alignment sample holder for submicron position adjustment
- Only minimum amount of sample alignment necessary when measuring series of samples
- Real time comparison with wavefront data from master lenses or design files
- High accuracy
- Automatic focusing
- The automatic positioning of the wavefront sensor and the telescope in the exit pupil
- Point light source with different numerical apertures available (up to 0.95)
- Vibration insensitive
- Comprehensive software for the wavefront and surface measurement with Shack-Hartmann Sensor
Applications
The WaveMaster® Compact 2 Universal uses its built-in Shack-Hartmann sensor to determine the following parameters:
- Measurement of the wavefront (PV, RMS) and surface topography
- Determination of the Zernike coefficients
- Measurement of the Point Spread Function (PSF)
- Measurement of the Modulation Transfer Function (MTF)
- Measurement of the Strehl ratio
- Wedge angle
- Measuring the surface topography of aspherical lenses, spheres and plane surfaces
- Radius measurement
The WaveMaster® Compact 2 Universal works in transmission and in reflection
WaveMaster® Software - Wavefront Measurement with Shack-Hartmann Sensors
The WaveMaster® software is clearly structured, easy to use and contains all functions to align samples with the WaveMaster® instruments in order to measure and analyze them.
The software communicates with the Shack-Hartmann sensor and analyzes the measured wavefront and surface in real time. In addition, it controls the WaveMaster® instruments.
Advantages:
- Menu-driven operator guidance
- Simple and intuitive measurement and analysis of wavefronts and surfaces
- One software package for everything: Data collection, data calculation, calibration and display of data, real-time analysis
- Representation of the surface topography through multiple parameterizations:
- Asphere equation
- Zernike polynomials
- Conical equation
- Spherical equation
- Free-form surface
- Load theoretical data from ZEMAX and Code V and compare in real time during measurements
- MTF and PSF
Details on Software:
Basic Functions:
- Real-time measurement and analysis of wavefront
- Display of
- 2D- of 3D-wavefront, -fringes and –phase
- PV and RMS
- Intensity
- Local slopes
- Camera image
- Absolute and relative measurement mode
- Real-time comparison with master lens or design data
- Wavefront and camera image averaging
- Adjustable masking of measurement and analysis area
- Storable configuration files
- Certificates
- Multiple analysis modules available
MTF/PSF analysis module:
- Real time calculation and display 3D MTF and PSF data
- Table with MTF measurement results
- Export function of measurement results
- Calculation of Strehl ratio
ZERNIKE analysis module:
- Real time Zernike fit and analysis of wavefront data
- Numerical and graphical display of fit results
- Import of theoretical wavefront data from ZEMAX and CODE V for real time comparison
- Export of wavefront data and analysis results to ASCII and ZEMAX format
- Display of Zernike coefficient trend
INSTRUMENT control:
- Autofocus function
- Automatic finding of exit pupil plane
- Automatic sample positioning (option)
Technical Data of the Shack-Hartmann Sensor based WaveMaster® Compact 2
| TRANSMISSION | |
|---|---|
| Measurement configuration: | • Wavefrontmeasurement of lenses • Transmission • Infinite set up |
| Sample diameter (1): | 0.5mm ... 14 mm |
| Sample EFL (2): | -30 ± 100 mm |
| Wavelength (3): | 365 nm ... 1064 nm |
| Sample holder: | • Single seat • Manual positioning |
| Wavefront accuracy | < λ/20 (RMS) |
| Wavefront repeatability | < λ/200 (RMS) |
| Dynamic range | > 2000 λ |
| Measurement frequency | up to 12 Hz |
| Lateral resolution | 138 x 138 |
| REFLECTION | |
|---|---|
| Measurement configuration: | • Surface topography measurement of lens, • Measurement of lens mold and stamp surfaces • Measurement of radius of curvature of best fit sphere • Reflection |
| Sample size (4): | 0.5 mm ... 18 mm |
| Radius of curvature (5): | -50 mm ± 30 mm |
| Wavelength: | 365 nm ... 635 nm |
| Sample holder: | • Single seat • Manual positioning |
| Profile accuracy | < 0.050 µm (RMS) |
| Profile repeatability | < 0.005 µm (RMS) |
| Dynamic range | > 200 µm |
| Maximum asphericity (6) | ≤ 7° |
| Measurement frequency | up to 12 Hz |
| Lateral resolution | 138 x 138 |
(1) Depending on telescope
(2) Depending on light source
(3) According to customer’s choice
(4) Depending on radius of curvature and illumination lens
(5) Depending on illumination lens and sample diameter
(6) Local deviation from the best fit sphere
Upgrades & Accessories
The wavefront instruments are characterized by a flexible design which allows for the adaption of the instruments to specific demands of an application. With the help of the following accessories and upgrades the function of the WaveMaster® systems are extended.
Illumination
Light sources with different wavelengths as well as numerical apertures are available. Switching between numerical apertures is simplified due to kinematic mounts.
Telescopes
For maximum utilization of the sensor dynamic range and thus the lateral resolution a set of telescopes is available.
Depending on sample diameter and wavefront sensor dimensions the optimum magnification has to be selected. The kinematic mount allows for easy exchange of the telescopes.
WaveMaster® Compact 2 sample holder
